Main description:

Written by one of the very first practitioners of ICP-MS, a Practical Guide to ICP-MS and Other AS Techniques: A Tutorial for Beginners presents ICP-MS in a completely novel and refreshing way. By comparing it with other complimentary atomic spectroscopy (AS) techniques, it gives the trace element analysis user community a glimpse into why the technique was first developed and how the application landscape has defined its use today, 40 years after it was first commercialized in 1983.

What's new in the 4th edition...

Updated chapters on the fundamental principles and applications of ICP-MS

New chapters on complementary AS techniques including AA, AF, ICP-OES, MIP-AES, XRF, XRD, LIBS, LALI-TOFMS

Strategies for reducing errors and contamination with plasma spectrochemical techniques

Comparison of collision and reaction cells including triple/multi quad systems

Novel approaches to sample digestion

Alternative sample introduction accessories

Comprehensive glossary of terms used in AS

New vendor contact information

The book is not only suited for novices and beginners, but also for more experienced analytical scientists who want to know more about recent ICP-MS developments and where the technique might be heading in the future. Furthermore, it offers much needed guidance on how best to evaluate commercial AS instrumentation and what might be the best technique, based on your lab's specific application demands.

Contents:

Contents

Foreword

Preface

Acknowledgements

Author Bio

Chapter 1: An Overview of ICP Mass Spectrometry

Chapter 2: Principles of Ion Formation

Chapter 3: Sample Introduction

Chapter 4: Plasma Source

Chapter 5: Interface Region

Chapter 6: Ion Focusing System

Chapter 7: Mass Analyzers: Quadrupole Technology

Chapter 8: Mass Analyzers: Double-Focusing Magnetic Sector Technology

Chapter 9: Mass Analyzers: Time-Of-Flight Technology

Chapter 10: Mass Analyzers: Collision/Reaction Cell and Interface Technology

Chapter 11: Ion Detection

Chapter 12: Peak Measurement Protocol

Chapter 13: Methods of Quantitation

Chapter 14: Review of Interferences

Chapter 15: Routine Maintenance

Chapter 16: Sampling and Sample Preparation Procedures

Chapter 17: Reducing Errors from Contamination

Chapter 18: Alternative Sampling Accessories

Chapter 19: Trace Element Speciation Techniques

Chapter 20: The ICP-MS Application Landscape

Chapter 21: Fundamental Principles and Applications of Atomic Absorption/Fluorescence

Chapter 22: Fundamental Principles and Applications of ICP Optical Emission Spectrometry

Chapter 23: Fundamental Principles of Applications of Other Atomic Spectroscopic Techniques

X Ray Analytical Techniques (XRF/XRD)

Microwave Induced Plasma Atomic Emission Spectrometry (MIP-AES)

Laser Induced Breakdown Spectrometry (LIBS)

Laser Ionization Laser Ablation Time-Of-Flight Mass Spectrometry (LALI-TOF-MS)

Chapter 24: Comparing ICP-MS With Other Atomic Spectroscopy Techniques

Chapter 25: Cost of Analysis of AS Techniques

Chapter 26: How to Select an ICP-MS: Some Important Analytical Considerations

Chapter 27: Glossary of Terms Used in Atomic Spectroscopy (AS)

Chapter 28: Useful Contact Information